- 相关推荐
Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates
A double sinusoidal phase modulating (SPM) laser diode interferometer for thickness measurements of a transparent plate is presented. A carrier signal is given to the interference signal by using a piezoelectric transducer, and the SPM interferometry is applied to measure the thickness of a transparent plate. By combining the double-modulation technique with the Bessel function ratio method, the measurement error originating from light intensity fluctuations caused by the modulation current can be decreased greatly.The thicknesses of a glass parallel plate and a quartz glass are measured in real time, and the corresponding experimental results are also given.
作 者： 李代林 王向朝 刘英明 作者单位： Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 刊 名： 中国光学快报(英文版) ISTIC EI 英文刊名： CHINESE OPTICS LETTERS 年，卷(期)： 2004 2(6) 分类号： 关键词：【Double sinusoidal phase modulating l】相关文章：
Energy Stable Schemes for Cahn-Hilliard Phase-Field Model of Two-Phase Incompressible Flows04-26
BEC口试全真试题(phase II)05-04
BEC口试全真试题(phase III)05-04
七年级L13L14L15L16教案04-25
Recent progress in polymer/layered double hydroxide nanocomposites04-26
学科术语 L05-04
Determination of operational parameters of anaerobic phase for enhanced phosphorus removal in MBR04-26
七夕英语作文The Double-Seventh Day04-25
Gas phase tricholoethylene removal at low concentration using activated carbon fiber04-26
Recent Results on Fast Flow Gas-Phase Partial Oxidation of Lower Alkanes04-26